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data sheet, v 1.0, july 2008 TLE4998S3 tle4998s4 programmable linear hall sensor sensors never stop thinking.
edition 2008-07 published by infineon technologies ag, am campeon 1-12, 85579 neubiberg, germany ? infineon technologies ag 2008. all rights reserved. attention please! the information herein is given to describe certain components and shall not be considered as a guarantee of characteristics. terms of delivery and rights to technical change reserved. we hereby disclaim any and all warranties, including but not limited to warranties of non-infringement, regarding circuits, descriptions and charts stated herein. information for further information on technology, delivery terms and conditions and prices please contact your nearest infineon technologies office ( www.infineon.com ). warnings due to technical requirements components may contain dangerous substances. for information on the types in question please contact your nearest infineon technologies office. infineon technologies components may only be used in lif e-support devices or systems with the express written approval of infineon technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to affect the safe ty or effectiveness of that device or system. life support devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain and/or protect human life. if they fail, it is reasonable to assume that the health of the user or other persons may be endangered.
template: mc_a5_ds_tmplt.fm / 4 / 2004-09-15 tle4998s revision history: 2008-07 v 1.0 previous version: page subjects (major change s since last revision) we listen to your comments any information within this do cument that you feel is wron g, unclear or missing at all? your feedback will help us to continuously improve the quality of this document. please send your proposal (including a reference to th is document) to: sensors@infineon.com
tle4998s data sheet 4 v 1.0, 2008-07 1 overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 1.1 features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 1.2 target applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 1.3 pin configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 2 general . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 2.1 block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 2.2 functional description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 2.3 principle of operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 2.4 transfer functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 3 maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 4 operating range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 5 electrical, thermal, and magnetic parameters . . . . . . . . . . . . . . . . . . . 14 calculation of the junction tem perature . . . . . . . . . . . . . . . . . . . . . . 16 magnetic parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 6 signal processing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 magnetic field path . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 temperature compensation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 6.1 magnetic field ranges . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 6.2 gain setting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 6.3 offset setting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 6.4 dsp input low-pass filter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 6.5 clamping . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 7 error detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 7.1 voltages outside the operating range . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 7.2 eeprom error correction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 8 temperature compensation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 8.1 parameter calculation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 9 calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 9.1 calibration data memory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 9.2 programming interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 9.3 data transfer protocol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 9.4 programming of sensors wi th common suppl y lines . . . . . . . . . . . . . . . 30 10 application circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 11 TLE4998S3 package outlines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32 12 tle4998s4 package outlines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 13 sent output definition (sae j2716) . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
tle4998s data sheet 5 v 1.0, 2008-07 13.1 basic sent protocol definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34 13.2 unit time setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 13.3 checksum nibble detail s . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
programmable linear hall sensor data sheet 6 v 1.0, 2008-07 TLE4998S3 tle4998s4 type marking ordering code package TLE4998S3 4998s3 sp412108 pg-sso-3-10 tle4998s4 4998s4 sp412110 pg-sso-4-1 1 overview 1.1 features ? single edge nibble transm ission (sent) open-drain output signal (sae j2716) ? 20-bit digital signal processing (dsp) ? digital temperature compensation ? 16-bit overall resolution ? operates within automotive temperature range ? low drift of output signal over temperature and lifetime ? programmable parameters stored in eeprom with single-bit error correction: ? sent unit time ? magnetic range and sensitivity (gain), polarity of the output slope ? offset ? bandwidth ? clamping levels ? customer temperature co mpensation coefficients ? memory lock ? re-programmable unt il memory lock ? single supply voltage 4.5 - 5.5 v (4.1 - 16 v in extended range) ? operation between -200 mt and +200 mt within three ranges ? reverse-polarity and overvolt age protection for all pins ? output short-circuit protection ? on-board diagnostics (overvol tage, eeprom error, start up) ? output of internal magnetic field values and temperature ? programming and operation of multiple sensors wi th common power supply ? two-point calibration of magnetic transfer functi on without iteration steps ? high immunity against me chanical stress, emc, esd
tle4998s overview data sheet 7 v 1.0, 2008-07 1.2 target applications ? robust replacement of potentiometers ? no mechanical abrasion ? resistant to humidity, temper ature, pollution and vibration ? linear and angular position sensing in automotive app lications such as pedal position, suspension control, th rottle position, headlig ht levelling, and steering torque sensing ? sensing of high current for battery management, motor cont rol, and electronic fuses 1.3 pin configuration figure 1 and figure 2 show the location of the hall el ement in the chip and the distance between hall probe and the surface of the package. figure 1 TLE4998S3 pin configurat ion and hall cell location table 1 TLE4998S3 pin defini tions and functions pin no. symbol function 1 vdd supply voltage / pr ogramming interface 2 gnd ground 3 out output / programming interface 1 center of hall probe 23 aep0371 7 0.38 ?.05 2.03 ?.1 1.625 ?.1 hall-probe branded sid e
tle4998s overview data sheet 8 v 1.0, 2008-07 figure 2 tle4998s4 pin configurat ion and hall cell location table 2 tle4998s4 pin defini tions and functions pin no. symbol function 1 tst test pin (connection to gnd is recommended) 2 vdd supply voltage / pr ogramming interface 3 gnd ground 4 out output / programming interface aep0365 4 pg-sso-4-1: 0.3 d : distance chip to branded side of ic mm ?.08 hall-probe branded side d 2 3 4 1 center of sensitive area 2.67 1.53 b b a 0.2 a 0.2
tle4998s general data sheet 9 v 1.0, 2008-07 2 general 2.1 block diagram figure 3 is a simplified block diagram. figure 3 block diagram (tle4998s4) 2.2 functional description the linear hall ic tle4 998s has been de signed specifically to meet the requirements of highly accurate rotation and position detection, as we ll as for curr ent measurement applications. the sensor provides a digi tal sent signal based on the sae j2716 standard, which consists of a sequence of pu lses. each transmission has a constant number of nibbles containing the hall value, the temperatur e, and status information of the sensor. the output stage is an open-drain driver pu lling the output pin to low only. therefore, the high level needs to be obtained by an external pull-up resistor. this output type has the advantage that the receiver ma y use an even lower supply voltage (e.g. 3.3 v). in this case the pull-up resistor must be conn ected to the given receiver supply. the ic is produced in bicmos technology with high voltage capability, and it also has reverse-polarity protection. spinning hall bias a d dsp a d temp. sense rom eeprom interface out vdd gnd supply sent tst *) *) tle4998s4 only
tle4998s general data sheet 10 v 1.0, 2008-07 digital signal processi ng using a 16-bit dsp architec ture together with digital temperature compensation guar antee excellent long-time stab ility compared to analog compensation methods. while the overall resolution is 16 bits, some intern al stages work with resolutions up to 20 bits. 2.3 principle of operation ? a magnetic flux is meas ured by a hall-effect cell ? the output signal from the hall-effect ce ll is converted from analog to digital ? the chopped hall -effect cell and contin uous-time a/d conversion ensure a very low and stable ma gnetic offset ? a programmable low-pass filter to reduce noise ? the temperature is measur ed and a/d converted, too ? temperature compensation is done digitally using a second-order function ? digital processing of out put value is based on zero field and sensitivity value ? the output value range can be clamped by digital limiters ? the final output va lue is represented by the data nibbles of the sent protocol
tle4998s general data sheet 11 v 1.0, 2008-07 2.4 transfer functions the examples in figure 4 show how different magnetic field ranges can be mapped to the desired output value ranges. ? polarity mode: ? bipolar : magnetic fields can be measured in both orientations. the limit points do not ne cessarily have to be symmetric al around the zero field point ? unipolar : only north- or south-oriented magnetic fields are measured ? inversion: the gain can be set to both positi ve and negative values figure 4 examples of operation 0 4095 / 65535 50 -50 100 -100 200 -200 out 12 / out 16 0 0 b (mt) b (mt) b (mt) 0 0 0 out 12 / out 16 out 12 / out 16 4095 / 65535 4095 / 65535 example 1: -bipolar example 2: -unipolar - big offset example 3: - bipolar - inverted (neg. gain)
tle4998s maximum ratings data sheet 12 v 1.0, 2008-07 3 maximum ratings note: stresses above those listed under ?absolute maximum ratings? may cause permanent damage to t he device. this is a stress rating on ly and functional operation of the device at these or any other conditions above those indicated in the operational sectio ns of this specific ation is not implied. exposure to absolute maxi mum rating conditions for ex tended periods may affect device reliability. table 3 absolute maximum ratings parameter symbol limit values unit notes min. max. storage temperature t st - 40 150 c junction temperature t j - 40 170 1) 1) for limited time of 96 h. depends on customer temperat ure lifetime cycles. please ask for support by infineon c voltage on v dd pin with respect to ground v dd -18 18 v 2) 2) higher voltage stress than absolute maximum rating, e.g. 150% in latch-up tests is not applicable. in such cases, r series 100 for current limitation is required supply current @ overvoltage v dd max. i ddov - 15 ma reverse supply current @ v dd min. i ddrev -1 0 ma voltage on output pin with respect to ground v out -1 3) 3) i dd can exceed 10 ma when the voltage on out is pulled below -1 v (-5 v at room temperature) 18 4) 4) v dd = 5 v, open drain permanent low, for max. 10 minutes v magnetic field b max - unlimited t esd protection v esd - 4.0 kv according hbm jesd22-a114-b 5) 5) 100 pf and 1.5 k
tle4998s operating range data sheet 13 v 1.0, 2008-07 4 operating range the following operating conditions must not be exceed ed in order to ensure correct operation of the tle4998s. all parameters sp ecified in the followi ng sections refer to these operating condi tions, unless otherwise indicated. table 4 operating range parameter symbol limit values unit notes min. max. supply voltage v dd 4.5 5.5 v 4.1 1) 1) for reduced output accuracy 16 2) 2) for supply voltages > 12 v, a series resistance r series 100 is recommended v extended range output pull-up voltage 3) v pull-up - 18 v load resistance 3) 3) required output protocol characteristics depend on these parameters, r l must be according to max. output current r l 1 - k output current 3) i out 0 5 ma load capacitance 3) c l 1 8 nf junction temperature t j - 40 125 150 4) 4) for reduced magnetic accuracy; extended limits are taken for characteristics note: keeping signal levels within the limits specifie d in this table ensures operation without overload conditions. c for 5000 h for 1000 h not additive
tle4998s electrical, thermal, and magnetic parameters data sheet 14 v 1.0, 2008-07 5 electrical, thermal, and magnetic parameters table 5 electrical characteristics parameter symbol limit values unit notes min. typ. max. sent transmission time t sent - - 1 ms 1) 1) transmission time depends on the data values being sent an d on int. rc oscillator freq. variation of +/- 20% supply current i dd 3 6 8 ma output current @ out shorted to supply lines i outsh - 95 - ma v out = 5 v, max. 10 minutes thermal resistance TLE4998S3 r thja - 219 - k/w junction to air r thjc - 47 - k/w junction to case thermal resistance tle4998s4 r thja - 240 - k/w junction to air r thjc - 41 - k/w junction to case power-on time 2) 2) response time to set up output data at power on when a constant field is applied. the first value given has a 5% error, the second value has a 1% error. measured with 640-hz low-pass filter t pon - 0.7 15 2 20 ms 5% target out value 1% target out value power-on reset level v ddpon - 3.6 4 v output impedance z out 19 30 44 k 3) 3) vdd = 5v, open drain high state, voltage on out pin typ. 84% of vdd output fall time t fall 2 - 4 s v out 4.5 v to 0.5 v 4) 4) for v dd = 5 v, r l = 2.2 k , c l = 4.7 nf output rise time t rise - 20 - s v out 0.5 v to 4.5 v 4) 5) output low time t low - 9 - s sent edge generation output min. high time t high min - 36 - s sent ?0? nibble output max. high time t high max - 168 - s sent synchron. frame output low saturation voltage v outsat - 0.3 0.2 0.6 0.4 v i outsink = 5 ma i outsink = 2.2 ma output noise (rms) out noise - 1 2.5 lsb 12 6)
tle4998s electrical, thermal, and magnetic parameters data sheet 15 v 1.0, 2008-07 5) depends on external r l and c l 6) range 100 mt, gain 2.23, internal lp filter 244 hz, b = 0 mt, t = 25 c v out *) v dd 90% v dd 10% v dd t rise t t fall *) r l to v dd assumed t low t high v outsat
tle4998s electrical, thermal, and magnetic parameters data sheet 16 v 1.0, 2008-07 calculation of the junction temperature the internal powe r dissipation p tot of the sensor increas es the chip junction temperature above the ambient temperature. the power multiplied by th e total thermal resistance r thja (junction to ambient) added to t a leads to the final j unction temperature. r thja is the sum of the addition of the two components, junction to case and case to ambient . r thja = r thjc + r thca t j = t a + t t = r thja x p tot = r thja x ( v dd x i dd + v out x i out ) i dd , i out > 0, if direction is into ic example (assuming no load on vout and tle4998s4 type): ? v dd = 5 v ? i dd = 8 ma ? t = 240 [k/w] x (5 [v] x 0.00 8 [a] + 0 [va] ) = 9.6 k for moulded sensors, th e calculation with r thjc is more adequate. magnetic parameters table 6 magnetic characteristics parameter symbol limit values unit notes min. typ. max. sensitivity s 1) 1) defined as out / b 8.2 - 245 lsb 12 / mt programmable 2)3) 2) programmable in steps of 0.024% 3) @ v dd = 5 v and t j = 25 c temperature coefficient of sensitivity tc -150 0 150 ppm/ c 4) see figure 5 magnetic field range mfr 50 100 5) 200 mt programmable 6) integral nonlinearity inl - 0.1 - 0.1 %mfr 7)9) magnetic offset b os - 400 0 400 t 8)9) magnetic offset drift b os - 5 - 5 t / c error band 9) magnetic hysteresis b hys 0 - 10 t 10)
tle4998s electrical, thermal, and magnetic parameters data sheet 17 v 1.0, 2008-07 figure 5 drift of temperature coefficient 4) for any 1 st and 2 nd order polynomial, coefficient within definition in chapter 8. 5) this range is also used for temperatur e and offset pre-calibration of the ic 6) depending on offset and gain settings, the out put may already be saturated at lower fields 7) gain setup is 1.0 8) in operating temperature range and over lifetime 9) measured at 100 mt range 10) measured in 100 mt range, gain = 1, room temperature s ~ s(t)/s 0 -1 t j s 0 max. pos. tc-error tc max = s/ t max. neg. tc-error tc min = s/ t t 0 t min t max 0
tle4998s signal processing data sheet 18 v 1.0, 2008-07 6 signal processing the signal flow diagram in figure 6 shows the signal path and data-processing algorithm. figure 6 signal processing flow magnetic field path ? the analog output signal of the chopped hall-effect cell is converted to a digital signal in the continuous-tim e a/d converter. the range of t he chopped a/d co nverter can be set in several steps (see table 7 ). this gives a suitable level for the a/d converter ? after the a/d conversion, a digital low-pass filter reduces the bandwidth ( table 11 ) ? a multiplier amplif ies the value dependin g on the gain (see table 9 ) and temperature compensation settings ? the offset val ue is added (see table 10 ) ? a limiter reduces the resulting signal to 16 bits (see chapter 13 ) and feeds the protocol generation stage temperature compensation (details are listed in chapter 8 ) ? the output signal of the temper ature cell is also a/d converted stored in eeprom memory + x a d hall sensor limiter (clamp) out x range lp offset gain a d + -t 0 tc 1 temperature compensation 1 + x tc 2 x x protocol generation temperature sensor
tle4998s signal processing data sheet 19 v 1.0, 2008-07 ? the temperature is normalized by subt raction of the refe rence temperature t 0 value (zero point of the quadratic function) ? the linear path is multiplied with the tc 1 value ? in the quadratic path, the te mperature difference to t 0 is squared and multiplied with the tc 2 value ? both path outputs are adde d together and multiplied with the gain value from the eeprom 6.1 magnetic field ranges the working range of the magnet ic field defines the input range of the a/d converter. it is always symmetrical around the zero field point. any two points in the magnetic field range can be sele cted to be the end points of the output value. the output value is represented within the ra nge between the two points. in the case of fields higher than the range values, the outpu t signal may be distorted. the range must be set before the ca libration of offset and gain. table 7 range setting range range in mt 1) 1) ranges do not have a guaranteed absolute accuracy. the temperature pre-calibration is performed in the mid range (100 mt) parameter r low 50 3 mid 100 1 2) 2) setting r = 2 is not used, internally changed to r = 1 high 200 0 table 8 range parameter symbol limit values unit notes min. max. register size r 2 bit
tle4998s signal processing data sheet 20 v 1.0, 2008-07 6.2 gain setting the overall sensitivity is defined by the range and t he gain setting. the output of the adc is multiplied with the gain value. the gain va lue can be calculated by : 6.3 offset setting the offset value corre sponds to an output value with zero field at the sensor. the offset value c an be calculated by: table 9gain parameter symbol limit values unit notes min. max. register size g 15 bit unsigned integer value gain range gain - 4.0 3.9998 - 1)2) 1) for gain values between - 0.5 and + 0.5, the numerical accuracy decreases to obtain a flatter output curve, it is advisable to select a higher range setting 2) a gain value of +1.0 corresponds to typical 32 lsb 12 /mt sensitivity (100 mt range, not guaranteed). it is crucial to do a final calibration of each ic within the application using the gain/out os value gain quantization steps gain 244.14 ppm corresponds to 1/4096 table 10 offset parameter symbol limit values unit notes min. max. register size os 15 bit unsigned integer value offset range out os -16384 16383 lsb 12 1) 1) infineon pre-calibrates the samples at zero field to 50% output value (100 mt range), but does not guarantee the value. therefore it is crucial to do a final calibration of each ic within the application offset quantization steps out os 1 lsb 12 gain g 16384 ? () 4096 --------------- -------------- - = out os os 16384 ? =
tle4998s signal processing data sheet 21 v 1.0, 2008-07 6.4 dsp input low-pass filter a digital low-pass filter is placed between the ha ll a/d converter and the dsp, and can be used to reduce th e noise level. the low-pass filter has a constant dc amplification of 0 db (gain of 1), which means that its settin g has no influence on the internal hall adc value. the bandwidth can be se t to any of 8 values. note: in range 7 (filter off), the output noise increases. table 11 low pass filter setting note: parameter lp cutoff frequency in hz (-3db point) 1) 1) as this is a digital filter running with an rc-based oscillator, the cutoff frequency may vary within 20% 0 80 1 240 2 440 3 640 4 860 5 1100 6 1390 7 off table 12 low-pass filter parameter symbol limit values unit notes min. max. register size lp 3 bit corner frequency variation f - 20 + 20 %
tle4998s signal processing data sheet 22 v 1.0, 2008-07 figure 7 shows the filter characte ristics as a magnitude plot (the highest setting is marked). the ?off? position would be a flat 0 db line. the update rate after the low-pass filter is 16 khz. figure 7 dsp input filter (magnitude plot) 10 1 10 2 10 3 0 -6 -5 -4 -3 -2 -1 magnitude (db) frequency (hz)
tle4998s signal processing data sheet 23 v 1.0, 2008-07 6.5 clamping the clamping fu nction is useful for separating the output range into an operating range and error ranges. if th e magnetic field is exceeding the selected measurement range, the output value out is limited to the clamping values. the clamping values are calculated by: clamping value low (deactivated if cl=0): clamping value high (dea ctivated if ch=127): table 13 clamping parameter symbol limit values unit notes min. max. register size cl,ch 2 x 7 bit (0...127) clamping value low out cl 0 65535 lsb 16 1) 1) for cl = 0 and ch = 127, the clamping function is disabled clamping value high out ch 0 65535 lsb 16 1) 2) 2) out cl < out ch mandatory clamping quantization steps out cx 512 lsb 16 3) 3) quantization starts for cl at 0 lsb 16 and for ch at 65535 lsb 16 out cl cl 32 16 ?? = out ch ch 1 + () 32 16 1 ? ?? =
tle4998s signal processing data sheet 24 v 1.0, 2008-07 figure 8 shows an example in which the magnetic field range between b min and b max is mapped to output va lues between 10240 lsb 16 and 55295 lsb 16 . figure 8 clamping example note: the clamping high value must be above the low value. if out cl is set to a higher value than out ch , the out ch value is dominating. this would lead to a constant output value indepen dent of the magnetic field strength. 0 b min b (mt) b max 65535 error range error range operating range out ch out (lsb 16 ) out cl 55295 10240
tle4998s error detection data sheet 25 v 1.0, 2008-07 7 error detection different error cases can be detected by the on -board diagnostics (obd) and reported to the microcontroller in the status nibble (see chapter 13 ). 7.1 voltages outside the operating range the output signals an error condition if v dd crosses the overvolt age threshold level. 7.2 eeprom error correction the parity method is ab le to correct a single bit in the eeprom line. one other single bit error in another eeprom lin e can also be detected, but not corrected. in an uncorrectable eeprom failure, the open drain st age is disabled and ke pt in the off state permanently (high ohmic/sensor defect). table 14 overvoltage parameter symbol limit values unit notes min. typ. max. overvoltage threshold v ddov 16.65 17.5 18.35 v 1) 1) overvoltage bit activated in status nibble, output stays in ?off? state (high ohmic)
tle4998s temperature compensation data sheet 26 v 1.0, 2008-07 8 temperature compensation the magnetic field strength of a magnet de pends on the temperatur e. this material constant is specific for the different magnet types. therefore, the tle4998s offers a second-order temperature compen sation polynomial, by which the hall signal output is multiplied in the dsp. there are th ree parameters for the compensation: ? reference temperature t 0 ? a linear part (1 st order) tc 1 ? a quadratic part (2 nd order) tc 2 the following form ula describes the sensitivity dependen t on the temperature in relation to the sensitivity at th e reference temperature t 0 : for more information, please refer to the signal processing flow in figure 6 . the full temperature compen sation of the complete syst em is done in two steps: 1. pre-calibration in th e infineon final test the parameters tc1, tc2, t0 are set to maximally flat temperature characteristics with respect to the hall probe a nd internal analog processing parts. 2. overall system calibration the typical coefficients tc1, tc2, t0 of the magnetic circuitry are programmed. this can be done deterministically, as the algorithm of the d sp is fully reproducible. the final setting of the tc1, tc2, t0 values depend on t he pre-calibrated values. table 15 temperature compensation parameter symbol limit values unit notes min. max. register size tc 1 tl - 9 bit unsigned integer values 1 st order coefficient tc 1 tc 1 -1000 2500 ppm/ c 1) 1) full adjustable range: -2441 to +5355 ppm/c, can be only used after confirmation by infineon quantization steps of tc 1 qtc 1 15.26 ppm/ c register size tc 2 tq - 8 bit unsigned integer values 2 nd order coefficient tc 2 tc 2 - 4 4 ppm/ c2 2) 2) full adjustable range: -15 to +15 ppm/c2, can be only used after confirmation by infineon quantization steps of tc 2 qtc 2 0.119 ppm/ c2 reference temp. t 0 - 48 64 c quantization steps of t 0 qt 0 1 c 3) 3) handled by algorithm only (see application note) s tc t () 1 tc 1 tt 0 ? () tc 2 tt 0 ? () 2 ++ =
tle4998s temperature compensation data sheet 27 v 1.0, 2008-07 8.1 parameter calculation the parameters tc 1 and tc 2 may be calculated by: now the digital output for a given field b in at a specific temperat ure can be calculated by: b fsr is the full-range magnetic field. it is dependent on the range setting (e.g 100 mt). s 0 is the nominal se nsitivity of the hall pr obe times the gain fact or set in the eeprom. s tc is the temperature-dependent sensitiv ity factor calculated by the dsp. s tchall is the temperature beha vior of the hall probe. the pre-calibration at infineon is performed such that the following condition is met: within the application, an additional factor b in (t) / b in (t 0 ) is given due to the magnetic system. s tc then needs to be modified to s tcnew so that the foll owing condition is satisfied: therefore, the new se nsitivity parameters s tcnew can be calculated from the pre- calibrated setup s tc using the relationship: tc 1 tl 160 ? 65536 ----------- ----------- 1000000 = tc 2 tq 128 ? 8388608 ------------ ----------- 1000000 = out 2 b in b fsr ------------ - s tc s tchall s 0 4096 ?? ?? ?? ? out os + = s tc t j t 0 ? () s tchall t j () 1 b in t () b in t 0 () ---------- ---------- s tcnew t () s tchall t () s tc t () s tchall t () 1 ? b in t () b in t 0 () ----------- --------- s tcnew t () s tc t ()
tle4998s calibration data sheet 28 v 1.0, 2008-07 9calibration for the calibration of the sensor, a special hardware interface to a pc is required. all calibration and setting bits ca n be temporarily written into a random access memory (ram). this allows the eeprom to remain untouched during the entire calibration process, since the number of the eeprom programming cycl es is limited. therefore, this temporary setup (u sing the ram onl y) does not stress the eeprom. the digital signal processing is completely deterministi c. this allows a two-point calibration to be performed in one step without iterations. afte r measuring the hall output signal for the two end points, the signal processi ng parameters gain and offset can be calculated. table 16 calibration characteristics parameter symbol limit values unit notes min. max. ambient temperature at calibration t cal 10 30 c 2 point calibration accuracy 1) 1) corresponds to 0.2% accuracy in each position out cal1 -8 8 lsb 12 position 1 out cal2 -8 8 lsb 12 position 2
tle4998s calibration data sheet 29 v 1.0, 2008-07 9.1 calibration data memory when the memlock bits are pr ogrammed (two redundant bits ), the memory content is frozen and may no longer be changed. furthe rmore, the programming interface is locked out and the chip remains in application mode onl y, preventing acci dental programming due to environmen tal influences. figure 9 eeprom map a matrix parity architecture allows automatic correction of any single -bit error. each row is protected by a row parity bit. the sum of bits set (inc luding this bit) must be an odd number (odd parity). each colu mn is additionally protected by a column parity bit. each bit in the even position s (0, 2, etc.) of all lines mu st sum up to an even number (even parity), and each bit in the odd posi tions (1, 3, etc.) mu st have an odd sum (odd parity). the parity column must have an even sum (even parity). this system of different parity calculations also protects a gainst many block errors (such as erasing a full line or even the whole eeprom). when modifying the application bi ts (such as gain, offset, tc, etc.), the parity bits must be updated. as for the column bits, the pr e-calibration area must be read out and considered for correct pari ty generation as well. note: a specific programming algorithm must be followed to ensure data retention. a detailed separate pr ogramming specification is available on request. user-calibration bits pre-calibration bits column parity bits row parity bits
tle4998s calibration data sheet 30 v 1.0, 2008-07 9.2 programming interface t he vdd pin and the out pin are used as a two-wire interface to transmit the eeprom data to and from the sensor. this allows: ? communication with high data reliability ? the bus-type connection of several sensors and separate programming via the out pin 9.3 data transfer protocol the data transfer protocol is described in a separate document (user programming description), avai lable on request. 9.4 programming of sensors with common supply lines in many automotive applications, two sensor s are used to measure the same parameter. this redundancy makes it possible to c ontinue operation in an emergency mode. if both sensors use the same power su pply lines, they can be pr ogrammed together in parallel. table 17 programming characteristics parameter symbol limit values unit notes min. max. number of eeprom programming cycles n prg - 10 cycles 1) 1) 1 cycle is the simultaneous change of 1 bit programming allowed only at start of lifetime ambient temperature at programming t prg 10 30 c programming time t prg 100 - ms for complete memory 2) 2) depending on clock frequency at v dd , write pulse 10 ms 1%, erase pulse 80 ms 1% calibration memory - 150 bit all active eeprom bits error correction - 26 bit all parity eeprom bits
tle4998s application circuit data sheet 31 v 1.0, 2008-07 10 application circuit figure 10 shows the connection of multiple sensors to a microcontroller. figure 10 application circuit note: for calibration an d programming, the interface has to be connected directly to the out pin. the application circuit shown sh ould be regarded as an exampl e only. it will need to be adapted to meet the requirements of other specific applications. tle 4998 optional v dd cc in1 cc in2 v gnd 47nf 1 nf 2k2 4.7nf 47nf 2k2 1 nf 4.7nf c out v dd gnd tle 4998 out v dd gnd 50 50 voltage supply sensor voltage supply c vdd out1 gnd out2 sensor module ecu module
tle4998s TLE4998S3 package outlines data sheet 32 v 1.0, 2008-07 11 TLE4998S3 package outlines figure 11 pg-sso-3-10 (plastic green single small outline package) 1) no solder function area molded body dimensions do not unclude plastic or metal protrusion of 0.15 max per side ?.3 12.7 ?.4 6.35 12.7 ? total tolerance at 19 pitches ? ?.3 4 19 ?.5 9 -0.50 +0.75 33 max. (useable length) (10) ?.5 18 a ?.5 6 1 -1 -0.15 0.25 ?.1 0.39 tape adhesive tape (0.25) 1 ?.2 1) 0.1 max. 0.5 0.5 ?.05 ?.1 0.42 3x 1.5 ?.05 4.06 4.05 ?.05 2 x 1.27 = 2.54 a 2 ?.05 1.5 0.36 ?.05 0.82 ?.05 p-pg-sso-3-10-po v02 45? 5? 123 b b c 2 c
tle4998s tle4998s4 package outlines data sheet 33 v 1.0, 2008-07 12 tle4998s4 package outlines figure 12 pg-sso-4-1 (plastic green single small outline package) 1) 1 max. 0.2 (0.25) 0.1 max. 1 x 45? 1.9 max. ?? ?.08 5.16 ?.05 5.34 0.2 +0.1 7? 7? -0.1 ?.08 ?.06 3.71 3.38 0.25 ?.05 a 2 1 ?.05 0.4 0.5 4x 0.6 max. 1.27 3 x 1.27 = 3.81 total tolerance at 10 pitches ? 1 ) no solder function area ?.3 ?.4 6.35 12.7 12.7 ? ?.5 -0.5 +0.75 4 ?.3 9 gpo0535 7 -0.15 ?.1 tape adhesiv e tape 0.25 0.39 ?.5 a 18 6 (useable length) (14.8) 23.8 ?.5 38 max. -1 1 14 3 2
tle4998s sent output definition (sae j2716) data sheet 34 v 1.0, 2008-07 13 sent output definition (sae j2716) the sensor supports a basic version of th e single edge nibble transmission (sent) protocol defined by sae. the main difference between the standard version and its implementation in the tle4998 is the usag e of an open drain instead of a push-pull output. 13.1 basic sent protocol definition ? the single edge is de fined by a 9-s low pulse on the output, fo llowed by the high time defined in the protocol (nominal values, may vary by tolerance of internal rc oscillator and the programming, see section 13.2 ). all values are multiples of a 3-s unit time frame concept. a transfer cons ists of the following parts:a synchronization period of 168 s (in parallel, a new sample is calculated) ? a status nibble of 36-81 s ? three data nibbles of 36-81 s (data packet 1 with a length of 108-243 s) ? three data nibbles of 36-81 s (data packet 2 with a length of 108-243 s) ? a crc nibble of 36-81 s figure 13 sent frame the crc checksum calculation in cludes the status nibble and the data nibbles. this leads to a minimum transfer time of 456 s, and a ma ximum transfer time of 816 s per sample. it is important to know that the sampling time (when values are ta ken for temperature compensation) here is always defined as th e beginning of the sy nchronization period; during this period, the resulting data is always calcul ated from scratch. compensate the sample transfer compensated sample sampling point: values taken from decimation filter register sensor processing output pin (physical) transferred data (logical) sync. period status nibble data nibble 1 hi g h data nibble 2 low crc nibble data nibble 1 mid next sampe
tle4998s sent output definition (sae j2716) data sheet 35 v 1.0, 2008-07 as only one hall val ue needs to be transfe rred within one sequenc e, the second data package is divided in to two parts (see table 20 ): ? first, the remaining 4 lsbs of the hall sign als are transferred in the first data nibble. this means the receiver may us e the whole 16-bit data available in the sensor when reading and using all 4 nibbles transferred. ? second, the temperature is transferred as an 8-bit value. the value is transferred in unsigned integer format and corresponds to - 55c to 200c. for ex ample, transferring the value 55 corresponds to 0c. the temperature is additional information and although it is not calibrated, may be us ed for a plausibility check, for example. the status nibble as de fined in the sae standar d has two free bits (t he lsbs or first and second bit). these bits contai n the selected magnetic range of the sensor and therefore allow the received data to be in terpreted easily. as no serial data is tr ansferred with the ic, the remaining bits of the status nibble are not required. the msb (fourth bit) notifying a start of a serial transmission and the data bit (or third bit) would be kept ze ro. thus, these bits are used in a more suitable way for this sensor, as shown in table 20 . in case of startup- or supply overvoltage condition, the open-drai n stage is disabled (high ohmic) and the co rresponding status bits are set. after vdd has re turned to the normal operating range, this status informati on will be transmitted within the first sent transmission. in case of uncorrectab le eeprom failure, the open-drain stage is disabl ed and is kept in ?switched off? state permanently (high ohmic/ sensor defe ct). the fourth bit is switched to ?1? for the first data packa ge transferred after a reset. this allows the receiver to detect low-voltage situations or emc pr oblems of the sensor . the third bit is se t to ?1? in case of an over-voltage condition of the ic. this signals that a sens or is still functioning, but its performance may be out of specification. it enables an early wa rning for high supply voltage, before the se nsor completely stop s functioning (e.g. v dd > 17.5 v, see chapter 7.1 ). table 18 mapping of temperature value junction temperature typ. decimal value from sensor note - 55c 0 theoretical lower limit 1) 1) theoretical range of temperature va lues, not operating temperature range 0c 55 25c 80 200c 255 theoretical upper limit 1)
tle4998s sent output definition (sae j2716) data sheet 36 v 1.0, 2008-07 13.2 unit time setup the basic sent protocol unit time granularity is defined as 3 s. every timing is a multiple of this basic time uni t. to achieve more flexibility, trimming of the unit time can be used to: ? allow a calibration trim with in a timing error of less than 20% clock error (as given in sae standard) ? allow a modification of the unit time for small speed adjustments this enables a setup of different unit times, even if the internal rc oscillator varies by 20%. of course, timing values that are too low could clash with ti ming requirements of the application and should theref ore be avoided, but in principl e it is possible to adjust the timer unit for a more precise protocol timing. table 19 predivider setting the nominal unit time is calculated by: parameter symbol limit values unit notes min. max. register size prediv 4 bit predivider 1) 1) useable predivider range is decimal 7 to 15. prediv < 7 is internally kept at 7. prediv default is decimal = 11 for 3 s nominal unit time unit time t unit 2.0 4.0 s clk unit =8mhz 2) 2) rc oscillator frequency variation +/- 20% t unit = ( prediv 2 + 2) / clk unit clk unit = 8mhz 20%
tle4998s sent output definition (sae j2716) data sheet 37 v 1.0, 2008-07 table 20 content of a sent data frame (8 nibbles) 1111 1111 1110 1111 65519 4094 1111 1111 1110 1110 65518 1111 1111 1110 : : 1111 1111 1110 0000 65504 1111 1111 1101 1111 65503 4093 4094 4094 4094 : : : : : : 0000 0000 0001 0000 16 1 0000 0000 0000 1110 14 0000 0000 0000 : : 0000 0000 0000 0001 1 0000 0000 0000 0000 0 0 0 0 0 0000 0000 0010 0000 32 2 0000 0000 0001 1111 31 0000 0000 0001 : : 1 1 0000 0000 0000 1111 15 0 1111 1111 1111 1111 1111 1111 1111 1111 d1 msn d1 midn d1 lsn d2 msn d2 midn d2 lsn bits description state range status and current range 10 rr 01 00 startup condition in range rr overvoltage in range rr normal state using range rr bits description 2 d1 lsn d2msn decimal: out 16 ( = out12*16+d2msn ) 1111 1111 1111 1110 1111 : 1111 0000 65535 (fsr) 65534 : 65520 d1 m i d n d1 m sn description 1 decimal: out 12 ( = d1 msn*256 +d1 midn*16 + d1ls n ) 4095 (fsr) 4095 4095 4095 1110 1111 184 c : : 0101 0000 0100 1111 24 c : 25 c : : : 0000 0001 -54 c 0011 0111 0c 0011 0110 : : -1c : 0000 0000 -55 c bits d2midn d2lsn 1111 1111 1111 1110 1111 : 1111 0000 description decimal: temp 8 ( = d2 midn* 16+d2ls n ) 200 c 199 c : 185 c sync status data word 1 data word 2 crc description crc calculation for all nibbles on the basis of sae j2716 seed value: 0101 polynomial: x 4 +x 3 +x 2 +1 bits description 11 01 00 +/- 50mt +/- 200mt +/- 100mt rr rr abbreviations: sync ? synchronization nibble status ? status nibble crc ? cyclic redundancy code nibble fsr ? full scale range msn ? most significant nibble midn ? middle nibble lsn ? least significant nibble out 12 ? 12 bit output value out 16 ? 16 bit output value temp 8 ? 8 bit temperature value
tle4998s sent output definition (sae j2716) data sheet 38 v 1.0, 2008-07 13.3 checksum nibble details the checksum nibble is a 4-bit crc of the dat a nibbles includi ng the status nibble. the crc is calculated us ing a polynomial x 4 +x 3 + x 2 + 1 with a seed value of 0101. in the tle4998s it is implem ented as a series of xor and shift operations as shown in the followi ng flowchart: figure 14 crc calculation a microcontroller implementati on may use an xor command plus a small 4-bit lookup table to calculate th e crc for each nibble. figure 15 example code for crc generation generator = 1101 seed = 0101 , use this constant as old crc value at first call pre-initialization : value xor seed xor only if msb = 1 value seed 0 <<1 genpoly xor value xor seed 4x crc calculation nibble next nibble // fast way for any c with low memory and compute capabilities char data[8] = {?}; // contains the input data (status nibble , 6 data nibble , crc) // required variables and lut char checksum, i; char crclookup[16] = {0, 13, 7, 10, 14, 3, 9, 4, 1, 12, 6, 11, 15, 2, 8, 5}; checksum= 5; // initialize checksum with seed "0101" for (i=0; i<7; i++) { checksum = checksum ^ data[i]; checksum = crclookup[checksum]; } ; // finally check if data [7] is equal to checksum
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